Gwyddion 2.5 is a C/C++ script for osCommerce Addons scripts design by David Necas.
It runs on following operating system: Windows / Linux / Mac OS / BSD. Publisher review:
Gwyddion is a modular program for SPM (scanning probe microscopy) data visualization and analysis. Gwyddion is a modular program for SPM (scanning probe microscopy) data visualization and analysis. Primarily it is intended for analysis of height fields obtained by means of scanning probe microscopy techniques (AFM, MFM, STM, SNOM/NSOM), however it can be generally used for any other height field and image analysis.Features: - visualization: false color representation with different types of mapping - shaded, logarithmical, gradient- and edge-detected, local contrast representation, Canny lines - OpenGL 3D data display: false color or material representation - easily editable color maps and OpenGL materials - basic operations: rotation, flipping, inversion, data arithmetic, crop, resampling - leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal - value reading, distance and angle measurement - profiles: profile extraction, measuring distances in profile graph, profile export - filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, checker pattern removal - general convolution filter with user-defined kernel - statistical functions: Ra, RMS, projected and surface area, inclination, histograms, correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, facet orientation analysis - statistical quantities calculated from area under arbitrary mask - row/column statistical quantities plots - grains: threshold marking and unmarking, watershed marking - grain statistics: overall and distributions of size, height, area, volume, boundary length, bounding dimensions - intergral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), wavelet anisotropy detection - fractal dimension analysis - data correction: spot remove, outlier marking, scar marking, several line correction methods (median, modus) - removal of data under arbitrary mask using Laplace or fractal interpolation - automatic xy plane rotation correction - arbitrary polynomial deformation on xy plane - 1D and 2D FFT filtering - fast scan axis drift correction - mask editting: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, shrinking - simple graph function fitting, critical dimension determination - axes scale callibration - merging and immersion of images - tip modelling, blind estimation, dilation and erosion Operating system:
Windows / Linux / Mac OS / BSD